An Effective Method for Detection and Analysis of DNA Damage Induced by Heavy-Ion Beams

Yusuke KAZAMA; Hiroyuki SAITO; Makoto FUJIWARA; Tomoki MATSUYAMA; Yoriko HAYASHI; Hiromichi RYUTO; Nobuhisa FUKUNISHI; Tomoko ABE

doi:10.1271/bbb.70571

この記事には本公開記事があります。本公開記事を参照してください。
引用する場合も本公開記事を引用してください。

An Effective Method for Detection and Analysis of DNA Damage Induced by Heavy-Ion Beams

Yusuke KAZAMA, Hiroyuki SAITO, Makoto FUJIWARA, Tomoki MATSUYAMA, Yoriko HAYASHI, Hiromichi RYUTO, Nobuhisa FUKUNISHI, Tomoko ABE

著者情報

キーワード: heavy-ion beam, linear energy transfer (LET), mutagenesis, visual screening, yellow fluorescent protein (YFP)

ジャーナルフリー早期公開

論文ID: 70571

DOI https://doi.org/10.1271/bbb.70571

この記事には本公開記事があります。

The final version of this article is now available: Vol. 71 (2007) , No. 11 p.2864

詳細

抄録

We have developed an efficient system to detect and analyze DNA mutations induced by heavy-ion beams in Arabiopsis thaliana. In this system, a stable transgenic Arabidopsis line that constitutively expresses a yellow fluorescent protein (YFP) by a single-copy gene at a genomic locus was constructed and irradiated with heavy-ion beams. The YFP gene is a target of mutagenesis, and its loss of function or expression can easily be detected by the disappearance of YFP signals in planta under microscopy. With this system, a ¹²C⁶⁺-induced mutant with single deletion and multiple base changes was isolated.

責任著者(Corresponding author)

J-STAGEへの登録はこちら（無料）