総説
飛行時間型2次イオン質量分析法による植物組織の分子レベル観察
2013 年 53 巻 1 号 p. 024-027
詳細
2013 年 53 巻 1 号 p. 024-027
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a non-destructive technique that allows for direct imaging of molecular ions with high spatial resolution on sample surface. In this review, the application of TOF-SIMS imaging at the cellular level in the investigation of wood chemical components including lignin is described.
