THE BULLETIN OF NATIONAL INSTITUTE of TECHNOLOGY, KISARAZU COLLEGE
Online ISSN : 2188-921X
Print ISSN : 2188-9201
ISSN-L : 0285-7901
Improvement of Reactive Etching System
Kouichi ISHIIShinji KODAIRA
Author information
RESEARCH REPORT / TECHNICAL REPORT FREE ACCESS

1994 Volume 27 Pages 19-22

Details
Abstract
A Reactive Ion Beam Etching (RIBE) system in our laboratory had good characteristics for mechanical etching but a poor rate for reactive etching. We have improved so that Reactive Ion Etching (RIE) is able to work with RF of 13.56 MHz in the same system. The improved parts are mainly a etching stage for RF injection and a cold trap with liquid nitrogen. As a result, the RIE operates at gas pressure with wide range of 20 - 500 [mTorr]. The etch rate for Niobium Nitride (NbN) is about 100 [A/min] at 20 [SCCM] of CF4 gas.
Content from these authors
© 1994 National Institute of Technology, Kisarazu College
Previous article Next article
feedback
Top