分光研究
Online ISSN : 1884-6785
Print ISSN : 0038-7002
ISSN-L : 0038-7002
スリット・プローブを用いた赤外ニア・フィールド顕微分光法
河田 聡高岡 秀行古川 祐光
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ジャーナル フリー

1996 年 45 巻 2 号 p. 93-99

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抄録
We developed a near-field scanning optical microscope (NSOM) giving infrared spectra in an area smaller than the diffraction limit of the infrared light. The developed NSOM features a probe which is equipped with a slit aperture to improve the efficiency in collecting the near-field light. The illumination light is generated with a Michelson interferometer as an interference light and the transmission spectrum of sample at the local position is given through the slit of probe. The experimental results with a test chart and a two-layered film show that the spatial resolution of the IR-NSOM developed depends only on the slit width and not on the wavelength of the illumination light. The spatial resolution of the microscope has been numerically analyzed with finite-difference time-domain (FD-TD) method.
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© 社団法人 日本分光学会
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