Proceedings of JIEP Annual Meeting
The 19th JIEP Annual Meeting
Session ID : 18A-05
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High heat resistance peelable type very thin copper foil
*Yuushi SatouNobuchika YagihashiHideo Suzuki
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
The mechanism of the peel strength increase between the supporting layer and the very thin copper foil layer after the curing process of polyimide has been studied. The copper atoms migrate through the separation layer and the copper bridge appears in this layer. By sandwiching this layer between the migration preventing layers, the peel strength keeps its original strength.
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© 2005 by The Japan Institute of Electronics Packaging
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