Proceedings of JIEP Annual Meeting
The 17th JIEP Annual Meeting
Session ID : 13A-11
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Host: japan institute of electronics packaging

Relationship between chemical structure and dielectric properties of flame retardants
*Satoru Amou, Akira Nagai, Yoshihiro Nakamura
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Keywords: flame retardants, printed circuit board , dielectric constant, dielectric loss tangent
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Abstract
We investigated relationship between chemical structure and dielectric properties of flame retardants for high frequency PCB. We obtained several flame retardants which showed low electric loss. They were organophosphates and they had a steric hindrance structure. We confirmed there was a good correlation between dielectric loss and dipole moment at room temperature of flame retardants.
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© 2003 by The Japan Institute of Electronics Packaging
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