Proceedings of JIEP Annual Meeting
The 21th JIEP Annual Meeting
Session ID : 16A-05
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Non-destractive detection of electrical connection failure by using passive intermodulation
Nobuhiro Kuga*Ken-ichi OhnishiMitsuru DoiMistusato Endo
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Non-destructive inspection is strongly demanded for a soldering connection failure such as Pin open. In this report, we propose a method based on passive intermodulation of electromagnetic wave. This is a non-destructive method that the feeding signals as well as resulting intermodulation signal are provided without physical connection. In this report, we present several experimental results on electrical contacts composed of conductive wires which are obtained in 2GHz band, to show the validity of the method. A result on actual soldered sample after heat-cycle test will be also shown.
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© 2007 by The Japan Institute of Electronics Packaging
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