Proceedings of JIEP Annual Meeting
The 22th JIEP Annual Meeting
Session ID : 18A-06
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Host: Japan Institute of Electronics Packaging

Calculation of Coupling Noise between traces in Sield Casing.
*Hideo Kikuchi
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Keywords: Equivalebt circuit
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Abstract
We have studied theoretical formula to get the value of coupling noisebetween traces in shield casing using models of eqivalent circuits. Resultsof simulations matched with the theoretical results.
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© 2008 by The Japan Institute of Electronics Packaging
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