Proceedings of JIEP Annual Meeting
The 23th JIEP Annual Meeting
Session ID : 11D-01
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Host: Japan Institute of Electronics Packaging

The 23th JIEP Annual Meeting
Test Circuit for Locating Open Leads of QFP ICS by Current Testing
*Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Akira Ono, Masao Takagi
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Keywords: Open Lead, Test Circuit, QFP, Elecctrical Test
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[in Japanese]
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© 2009 The Japan Institute of Electronics Packaging
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