Proceedings of JIEP Annual Meeting
The 23th JIEP Annual Meeting
Session ID : 11D-02
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Host: Japan Institute of Electronics Packaging

The 23th JIEP Annual Meeting
Open Lead Detection of Power Supply Leads by Measuring Supply Current of Test Circuit
*Akira Ono, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Masao Takagi, Masaki Hashizume
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Keywords: Open Lead, Supply Current Test, CMOS IC, VCC Lead
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[in Japanese]
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© 2009 The Japan Institute of Electronics Packaging
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