Proceedings of JIEP Annual Meeting
The 25th JIEP Annual Meeting
Session ID : 9C-08
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Host: Japan Institute of Electronics Packaging

The 25th JIEP Annual Meeting
Nondestructive Inspection of Automotive PCB and Mounted Electronic Components by Time Domain Reflectometry (TRD) Method
*Kazuki Nakano, Masao Kanatani, Hiroyuki Ishii, Mutsumi Shimazaki
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Keywords: Time-domain Reflectometry, Ball Grid array, Differentiated waveform, Probe, Failure detection
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[in Japanese]
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© 2011 The Japan Institute of Electronics Packaging
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