e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Regular Papers
Noncontact Atomic Force Microscopy Line-Profiling of Irregular Dimers on the Monohydride Si(001) Surface: Tight-Binding Simulation
Akira Masago
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2013 Volume 11 Pages 80-84

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Abstract

This paper describes curious behaviors in noncontact atomic force microscopy (NC-AFM) line-profiles simulated by the density-functional based tight-binding (DFTB) method. Although NC-AFM observes the surface corrugations in general, these line-profiles show atom-like peaks at vacancy sites. This is caused by a stronger interaction incident to the dangling bond. [DOI: 10.1380/ejssnt.2013.80]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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