J-STAGE Home  >  Publications - Top  > Bibliographic Information

e-Journal of Surface Science and Nanotechnology
Vol. 11 (2013) p. 80-84

Language:

http://doi.org/10.1380/ejssnt.2013.80

Regular Papers

This paper describes curious behaviors in noncontact atomic force microscopy (NC-AFM) line-profiles simulated by the density-functional based tight-binding (DFTB) method. Although NC-AFM observes the surface corrugations in general, these line-profiles show atom-like peaks at vacancy sites. This is caused by a stronger interaction incident to the dangling bond. [DOI: 10.1380/ejssnt.2013.80]

Article Tools

Share this Article