e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ALC '15-
Scanning Atom Probe Analysis Alternately Triggered by Voltage and Laser Pulse
Masahiro TaniguchiOsamu Nishikawa
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2016 Volume 14 Pages 69-72

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Abstract

Voltage pulse which has been used from the establishment of atom probe (AP) in the 1960's is going to be replaced by short pulsed laser with high repetition rate in the nanometer scale characterization of materials by 3D-AP. Scanning Atom Probe (SAP) has a miniature electrode for acceptance of non-needle shaped specimens which allows us to analyze non-solid materials which are common in chemistry. The selectivity and the adaptability of voltage pulse and laser pulse are not clear in the non-bulk materials which are common in chemistry but not familiar in AP field. Two types of trigger, voltage pulse and laser pulse, were applied alternately to the identical sample to perform direct comparison. Tungsten tip, conventional material in AP, and amino acid (L-Tryptophan) supported on carbon nanotube were chosen as candidates for this analysis. The dual trigger system successfully worked on metallic sample and the selectivity of the ion species and adaptability were demonstrated on molecular system. [DOI: 10.1380/ejssnt.2016.69]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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