PAb15 透過偏光解析法を用いた液晶自己保持膜の構造解析

抄録

Free-Standing film and its layer structure consist of the antiferroelectric liquid crystal were studied in terms of the optical analysis. The phase difference Δ of a Free-Standing film was measured by the transmission ellipsometry. In order to characterize the layer structure, the theoretical analysis was performed by 4 × 4 matrix method. As the result, It was found that; the layer structure near the surface of the film is different from that in the bulk. Within the temperature range of SmA^* phase, the director near the surface seems to be tilted. The layer structure of SmC^*_Aseems to be different between odd and even number of layers. Because of the residual polarization the director exhibits an unusual tilting behavior in case of the even number layers film.