The liquid crystal (LC) director reorientation at the interface between a substrate and an LC layer was investigated by the dye-doped reflection ellipsometry (DDRE). The experimental results demonstrated that the response of the ellipsometric angles under the applied voltage were in good agreement with the numerical results where the optical components such as the glass substrate, an insulating film, an ITO film and an alignment film were taken into account. From the analysis of the experimantal results, it was found that the DDRE has a potential to evaluate the polar anchoring strength of LC cells.
