simultaneous observation of polarizing microscopy and SAXS of layer rotation in SSFLC

Abstract

The smectic layers rotate by applying an asymmetric electric field. We develop a system to measure simultaneously the polarizing microscopy and small angle x-ray scattering (SAXS), and have investigated this phenomenon. The rotation angle of the Bragg spot was approximately equal to that of the stripe texture. Bragg spots split in azimuthal direction, and it means that layers can rotate with keeping horizontal chevron structure.