日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2000年 日本液晶学会討論会
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PAb19 偏光解析法を用いたTNセルのねじれ角/セル厚同時測定によるアンカリングエネルギーの決定法(II)
*木村 宗弘赤羽 正志
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p. 247-248

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It is experimentally demonstrated that selecting an appropriate wave length of the incident light is required to avoid the Mauguin Minimum condition in which the actual twist angle cannot be estimated by optical measurement. The all of the optical component such as the glass substrates, indium thin oxide electrode films, alignment films and liquid crystal itself play an important role in the optical polarization state of the outgoing light, therefore we re-examined the measurement method for the evaluation of the anchoring strength and proposed a modified method by using multi-wavelength laser.
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© 2000 日本液晶学会
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