日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2000年 日本液晶学会討論会
会議情報

PCb04 フリッカー観測によるイオン密度測定法
*笹木 宣良
著者情報
会議録・要旨集 フリー

p. 345-346

詳細
抄録

A novel measurement method has been developed to optically measure ion density in TFT-LCD panels. We investigated the optical response of twisted-nematic (TN) cells when ions were transported by applying an alternating electric field. A characteristic flickering of transmitted light was observed when a rectangular voltage with a low frequency of 1 Hz was applied to the cells. A peak in light intensity was observed during voltage application. Its height was found to be related to ion density in a linear way. This density was measured by using the transient current technique. We conclude that ion density can be determined by measuring optical response.

著者関連情報
© 2000 日本液晶学会
前の記事 次の記事
feedback
Top