2B03 液晶自己保持膜の光学的性質

抄録

The refractive indices of the Free-Standing Films (FSFs) with more than 100(nm) thickness were evaluated by the transmission ellipsometry. The refractive indices of the FSFs with more than 1000(nm) thickness were constant to the film thickness. While, the data of FSFs with less than 1000 (nm) thickness scattered widely depending on the film thickness, because the influence of the refractive indcies and the film thickness could not be separated.