3C01 偏光解析を用いた液晶材料の屈折率波長分散の評価II(物理・物性)

抄録

Renormalized transmission ellipsometry was applied to a measurement of anisotropic refractive indices of nematic liquid crystals by using the twisted nematic (TN) cell. The twist angle of the liquid crystal director between the upper and lower substrates can be also estimated by applying the 4×4 matrix method. In comparison with the n_o (λ) and n_e (λ) evaluated by using the homogeneous alignment cell, these results suggest that both of the measured refractive indices are in good agreement even if in case of the large twist angle.