日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2016年 日本液晶学会討論会
セッションID: PA09
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電圧対静電容量特性を用いたフレクソ係数の測定における不純物イオンの影響
*伊皆 健太郎工藤 幸寛高橋 泰樹
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A light leakage from pixel edges with the high resolution LC panel has been noticed. It is considered that a flexoelectric effect is one of causes. Evaluations of the flexo-coefficient of LC materials is required. However, the separation of impurity ions which is contained LC materials is the most difficult problem. Our group have attempted to evaluate the flexo-coefficients (e11+e33) for the pure LC materials by extrapolating the graph of the flexo-coefficients vs VHR curve. Then, 12.34 pC/m of the coefficient (e11 + e33) was estimated with no impurity ions for the nematic mixture ZLI-4792.

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