主催: 一般社団法人日本液晶学会
会議名: 2020年日本液晶学会オンライン研究発表会
開催地: オンライン
開催日: 2020/10/29 - 2020/10/30
We have previously proposed a method for measuring the flexo coefficient en using a HAN cell with concentric circular rubbing on the substrate with linear interdigitated-shaped electrodes. The method uses disclination lines by the reverse twist caused by inducing the flexo effect under applying the dc voltage. In this research, we propose an improved measurement method using a combination of “concentric interdigitated electrodes and straight rubbing” instead of “concentric rubbing and straight interdigitate electrodes” in conventional to easier measurement.