液晶討論会講演予稿集
Online ISSN : 2432-9959
Print ISSN : 1880-3539
ISSN-L : 1880-3539
第21回 液晶討論会
セッションID: 1D05
会議情報

X線回折・散乱測定用2重湾曲W/Si多層膜ミラーを用いた点集束カメラの試作と液晶相転移観察への応用
*Robert V. LAW笹沼 裕二小林 勇二
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抄録
In recent years the imaging plate(IP) has attracted much attention as a new sensitive two-dimensional detector for X-rays. In this study we have developed a point-focusing small angle X-ray scattering(SAXS) camera using a doubly curved W/Si monochromator. Combined with the IP, the set-up allows us to obtain well-defined images even from short-time X-ray exposures and to carry out time-resolved SAXS measurements. As an example, we will report SAXS observations during the SA*-N* transition of a ferroelectric liquid crystal 4-(2'-methylbutyl)phenyl-4'-n-octylbiphenyl-4-carboxylate(2M4P8BC), and compare the corresponding DSC data.
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© 1995 一般社団法人日本液晶学会
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