抄録
Extremely thin free-standing ferroelectric and polymeric ferroelectric liquid crystal films with the thicknesses in the range of several tens and hundreds nm have been fabricated. successfully. The structure and electrooptical properties have been studied by ellipsometric measurements. Both SmA and SmC* phases still exist even in such ultra thin films. Electrooptical measurement with crossed polarizers was carried out. From the results of the electrooptical measurement, the phenomenon that disturbs the electrooptical response was found in the higher temperature range of the SmC* phase.