Residual DC Voltage Measurement Utilizing Capacitor's Dielectric Absorption Method

Abstract

It has been known that the electrical charge created within interface between liquid crystal and alignment layer by applying DC voltage to liquid crystal cells causes image sticking. This led us to assumption that we could quantitatively evaluate capacitor's dielectric absorption. We apply DC voltage to capacitor and measure the residual DC voltage after the capacitor is short-circuited. Results of the actual measurement and the simulation calculation showed that the residual voltage varied depending on thickness of the alignment layer.