抄録
A new approach was performed in order to obtain crystallographic data such as lattice constants of crystalline phases and lattice orientation relationship among them, which compose mineral textures in small area of 10-100 μm diameter. The principle of the technique is based on a single crystal X-ray diffraction method, and specimens examined by an optical microscope, SEM, EPMA, etc. can be available without separations. By this method, we can analyze mineral textures not only by chemical or morphological aspects but also from a crystallographic point of view. Main features of the system stand on the use of one dimensional cylindrical PSPC combined with automated small three-circle goniometers and development of new softwares for obtaining X-ray diffraction peaks from small areas and for analyzing them. Some applications of this method are also reported.
