Journal of the Mineralogical Society of Japan
Online ISSN : 1883-7018
Print ISSN : 0454-1146
ISSN-L : 0454-1146
A New Imaging Plate System for Transmission Electoron Microscopy
Seiichiro UEHARA
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1997 Volume 26 Issue 4 Pages 221-226

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Abstract
A new Imaging Plate (IP) system for transmission electron microscopy (TEM), which has a pixel size of 25μm×25μm, has been developed by Fuji Photo Film Co., Ltd. (1994). In this paper the new IP system is briefly reviewed and tested. The characteristics of the new IP are high sensitivity, wide dynamic range and linear sensitivity compared with those of photographic film for TEM. It is very useful for high-resolution TEM of electron-beam sensitive minerals. Furthermore, digitally recorded TEM images are convenient for image processing.
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