X線回折法による極微小鉱物の精密分析

抄録

The resolution and precision of X-ray powder diffraction data of a silicon standard obtained by a Gandolfi camera were examined by comparing with those obtained by a diffractometer. The peak width (FWHM) and integral breadth of reflections obtained by a Gandolfi camera take vales similar to those obtained by a diffractometer. The reflections of a Gandolfi camera have symmetrical profiles in contrast to the asymmetric ones of a diffractometer. The peak positions can be determined with an error less than 0.01°(2θ) even by using a Gandolfi camera. These results suggest that precise X-ray diffraction analysis can be made also for a very small mineral, 10-100μm in size, by a Gandolfi camera.