2019 年 29 巻 2 号 p. 73-76
The overview of the recent works by the author at iMATERIA, BL20 of J-PARC MLF is introduced. From the viewpoint of microstructural control, the author and coworkers have expanded the availability of iMATERIA to metallurgical studies. The authors have established the measurement/analysis scheme for crystallographic textures and phase fractions in metallic materials using Rietveld texture analysis. More recently, the authors have developed the in situ measurement environments at high temperatures and under mechanical loading. Thanks to the intense neutron source of J-PARC and the numerous detectors of iMATERIA, dynamic observation of microstructural changes during processing has become possible. This is extensively being used both by academic and industrial researchers.