特集 「PIXE分析法」
位置敏感型の結晶分光器による高分解能PIXE分析
1997 年 23 巻 4 号 p. 9-19
詳細
1997 年 23 巻 4 号 p. 9-19
Experimental arrangements and procedures for high-resolution PIXE measurements using a crystal spectrometer equipped with a position-sensitive proportional counter are presented. Utilities of the high-resolution PIXE system for element analysis, chemical state analysis and a study on the charge-up effect are demonstrated.
