1998 年 24 巻 1 号 p. 85-95
X-ray detectors using avalanche photodiodes (APDs) have been developed for fast counting measurements. One of the APD detectors has a stack of four silicon APDs. The stack of APDs improves intrinsic efficiency for X-rays, such as 55% at 16.53 keV. The output rates reaches 4.6×108 counts/s at 16.53 keV. The dynamic range of more than 1010 is useful for synchrotron X-ray diffraction experiments.