Abstract
In order to investigate the transient space charge formation in the dielectric materials, short interval space charge measurement systems were developed. The interval of space charge measurement was limited by frequency characteristics of excitation pulse generator and recording digitizing oscilloscope. In this report, we developed shorter interval space charge measurement system using recently available low cost long memory digitizing oscilloscope and high speed switching semiconductors. With this system, the change of space charge distributions in every 10μs interval were measured in a 100μm thick low density polyethylene(LDPE) film.