IEEJ Transactions on Fundamentals and Materials
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
Letter
Dependence of Mocrowave-plasma Density Sustained Below the Resonance on the Thickness of Dielectric Window
Yoshihisa TakahashiSumio Kogoshi
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2003 Volume 123 Issue 5 Pages 519-520

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Abstract

It has been shown experimentally that the electron density changes periodically when the thickness of the dielectric window changes in wave guide mode discharges, or hybrid surface wave mode discharges. It suggests there is a optimum thickness of the dielectric window.

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© 2003 by the Institute of Electrical Engineers of Japan
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