電気学会論文誌A(基礎・材料・共通部門誌)
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
研究開発レター
模擬ボイドモデルを用いた微小空隙内の PD 劣化·破壊特性
今井 國治
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ジャーナル フリー

2003 年 123 巻 8 号 p. 819-820

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In this study, an artificial void model was made on the basis of the Whitehead abc model and time to breakdown of a PP film which formed the artificial void was investigated with the Weibull distribution. Voltage dependence of time to breakdown of the PP film (V-t characteristic) becomes discontinuous at a certain voltage between 12 and 13kV. Furthermore, repetition of the breakdown mechanism transition (fatigue-failure- type→ random-failure-type or early/random-failure- type) occurs at the certain voltage. These results suggest that patterns of surface discharge in the artificial void change from Polbüschel to Gleitbüschel.
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© 電気学会 2003
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