抄録
The paper proposes an application of elliptic function to a new measuring method of electric resistivity of outer-semiconductive layer of XLPE cable. The new measuring method may substitute the conventional method.
The resistivity can be obtained easily by measuring resistance between two electrodes which are attached to a circumferential edge on one side of the outer-semiconductive layer of a cable core sample. The solution process is applicable to heat conduction as well as hydromechanics.
