暗号モジュールに対する意図的な電磁妨害による故障発生メカニズムに関する基礎的検討

抄録

This paper investigates a mechanism of faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI) which causes information leakage in electric devices without disrupting their functions or damaging their components. We show the mechanism of fault occurrence through experiments using the faulty ciphertexts and the pulse injection to the specific round. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup-time violation to the cryptographic module.