精密位相雑音測定におけるサンプリングクロックの影響

平野 育; 柳町 真也; 池上 健; 高見澤 昭文

doi:10.1541/ieejfms.136.455

IEEJ Transactions on Fundamentals and Materials

Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205

Technical Note

Influence of the Sampling Clock on the Precise Phase Noise Measurement

Iku Hirano, Shinya Yanagimachi, Takeshi Ikegami, Akifumi Takamizawa

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Keywords: low offset frequency, spectral line, phase noise, discrete fourier transformation, hydrogen maser

JOURNAL FREE ACCESS

2016 Volume 136 Issue 7 Pages 455-457

DOI https://doi.org/10.1541/ieejfms.136.455

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Abstract

In the precise phase noise measurement, we studied the influence of the relation between the frequency of the measured signal and sampling frequency on the phase noise value. It is revealed that the error of the phase noise L(f) decreases with the increasing of the offset frequency in the L(f) characteristic.

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