IEEJ Transactions on Fundamentals and Materials
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
Special Issue Paper
High-precision Absolute Value Measurement of Reflection by Time Domain OCT
Masayuki TanakaTatsuo Shiina
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2018 Volume 138 Issue 5 Pages 198-203

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Abstract

Typical reflectometers have their own standards for measurement values, and they cannot evaluate a certain index each other because of lack of common understanding. Recently there is great demand to measure an absolute value of small reflection in optical communication field. We developed a specialized TD-OCT to evaluate an absolute value of reflection. TD type can evaluate the reflection value directly and linearly. The rotating optical path scanner was installed into the specialized TD-OCT to generate the optical path change of 20 mm. We specially arranged the 4-stage amplifier for the sensitivity of 100 dB. As a result, we got its good linearity of the reflection measurement results within the deviation of +/-3 dB in the range between 10 to 100 dB.

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© 2018 by the Institute of Electrical Engineers of Japan
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