タイミング違反の検出に基づくIC内部の処理に過渡電磁界の与える影響評価

抄録

Sufficient evaluation for effects caused by electromagnetic interference is required, since faults in information processing inside ICs may cause not only data destruction but also security deterioration. Effect evaluation methods focusing on processing inside ICs have not been sufficiently studied. In this paper, we propose an effect evaluation method using an evaluation circuit that can detect setup time violation (STV), which is one of mechanisms of fault occurrence inside ICs caused by external noises. The evaluation circuit has a long path delay. Since the output of the evaluation circuit changes depending on the clock cycle, it is possible to detect occurrence of the STV. To confirm the possibility to detect STV occurrence using the evaluation circuit, we conducted the experiment to generate STV by inserting a glitch simulating electrostatic discharge into the clock signal in the target circuit. As a result, the evaluation circuit succeeded to detect the STV occurrence and it is confirmed that the proposed effect evaluation method by external noise using the evaluation circuit works effectively.