The conducted noise signal induced by electromagnetic interference enters the device as a common mode noise and receives the mode conversion inside the device to become a noise signal that is a cause of malfunction. The quantitative evaluation of malfunctions requires the amount of mode conversion to understand noise signals. Therefore in this paper, we propose a method to obtain the mode conversion amount from the common mode noise to differential mode noise as the voltage attenuation characteristic by voltage excitation and potential difference observation. The validity of the proposed method was shown by comparison with the measurement results for the differential line using the conventional method and by comparing the conventional method with the proposed method by circuit simulation. In addition, by applying it to an operating board on which an IC is mounted and confirming its effectiveness.
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