XPS Study of Band Alignment at Au/Polypropylene Interface

Abstract

Since charge injection from metal into dielectric leads to electrical degradation and failure of various electrical and power devices, it is essential to reveal the band alignment of the metal/dielectric interface. However, the band alignment of the metal/dielectric interface remains theoretically unexplored and has not been experimentally obtained. This paper reveals the band alignment at Au/polypropylene (PP) interface by X-ray photoemission spectroscopy (XPS) measurements. The hole injection barrier at the Au/PP interface was measured to be 3.4 eV.