IEEJ Transactions on Fundamentals and Materials
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
Paper
Ultra-minimally Invasive Current Measurement in Fast Switching GaN Devices using Optical Probe Current Sensor
Satoshi SueMitsunori MiyamotoToshiya KuboMakoto SoneharaToshiro SatoRyu Nagahama
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2025 Volume 145 Issue 2 Pages 37-43

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Abstract

Previously, the authors have proposed a contactless probe-type current sensor with low insertion impedance. In this paper, the insertion impedance of the proposed current sensor at high frequencies are clarified. Then, we measured the actual high-speed switching current flowing through a GaN device and compared the measured waveforms with those of a coaxial-type shunt resistor. Comparison of the measured waveforms showed that the coaxial shunt resistor exhibited ringing in the waveform due to the effect of insertion impedance, but the proposed current sensor exhibited less ringing, indicating that the measurement is minimally invasive to the circuit under test.

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© 2025 by the Institute of Electrical Engineers of Japan
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