A Reliability Analysis Method of Statistical Data: The Boot- strap.-For Applications of Lifetime and Dielectric Break- down Voltage Estimation and etc.

Hideo Hirose

doi:10.1541/ieejfms1990.112.4_251

IEEJ Transactions on Fundamentals and Materials

Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205

A Reliability Analysis Method of Statistical Data: The Boot- strap.-For Applications of Lifetime and Dielectric Break- down Voltage Estimation and etc.

Hideo Hirose

Author information

JOURNAL FREE ACCESS

1992 Volume 112 Issue 4 Pages 251-258

DOI https://doi.org/10.1541/ieejfms1990.112.4_251

Details

Article 1st page

Content from these authors

Favorites & Alerts

Recently viewed articles

Announcements from publisher

A member of IEEJ can access the transactions of the Technical Society to which the member belongs. Please enter the My Page login ID in the subscriber number column and the birth date (year/month/date with one-byte characters: for example, 19800303) in the password column.

Predecessor

The transactions of the Institute of Electrical Engineers of Japan.A

The Journal of the Institute of Electrical Engineers of Japan

Related information

https://www.jstage.jst.go.jp/browse

Related journals

The Journal of The Institute of Electrical Engineers of Japan

IEEJ Transactions on Power and Energy

IEEJ Transactions on Electronics, Information and Systems

IEEJ Transactions on Industry Applications

IEEJ Journal of Industry Applications

IEEJ Transactions on Sensors and Micromachines