Abstract
Voltage generated in MIM structures of polymide LB films is analyzed by diffusion of electronic carriers in the LB films. The DC voltage of several hundred milivolts is generated in the MIM and the current in the outer circuit of the MIM becomes nearly constant after several hours. In this paper, first, diffusion constant of the carrier (electron) in polyimide LB films is measured, then diffusion current is decided. On the other hand, conduction current in the LB films due to the generated voltage is measured then conductivity of polyimide LB films is decided. Next generated voltage is analytically calculated in various values of resistance in the outer circuit of the MIM and it coincides with the value measured in the experiments.
