Influence of Bow-tie Trees on the Residual AC Breakdown Voltage of Dry-Cured XLPE Power Cables under Immersed Accelerated Aging Test

Toshinari Hashizume; Chiharu Shinoda; Kazunari Nakamura; Masahiro Hotta; Tsuneo Tani

doi:10.1541/ieejfms1990.114.3_258

Toshinari Hashizume, Chiharu Shinoda, Kazunari Nakamura, Masahiro Hotta, Tsuneo Tani

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JOURNAL FREE ACCESS

1994 Volume 114 Issue 3 Pages 258-266

DOI https://doi.org/10.1541/ieejfms1990.114.3_258

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Published: March 20, 1994 Received: March 17, 1993 Available on J-STAGE: July 15, 2008 Accepted: - Advance online publication: - Revised: -
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Date of correction: July 15, 2008 Reason for correction: - Correction: DTRECEIVED Details: Wrong : 19920724
Right : 19930317

Date of correction: July 15, 2008 Reason for correction: - Correction: ABSTRACT Details: Wrong : This paper describes the change of the residual AC breakdown voltages of 6.6kV dry-cured XLPE cables during an immersed accelerated aging test. The influence of bow-tie trees on the breakdown voltages was investigated in detail. The accelerated tests was carried out by applying 6.9kV (1kHz) at room temperature with the conductor strands and insulation shields kept constantly moist. In the breakdown tests, the initial voltage step was 35kV/hour and subsequent voltage step was 5kV/half hour. The residual breakdown voltage changes very much during the accelerated test. From the results of Weibull distribution plot on the AC breakdown voltages, the cause of the breakdown can be divided into three regions; Region A (35kV), Region B (35-90kV) and Region C (>90kV). To clarify the causes of each regions, we used the prebreakdown partial discharge detection method to determine the starting point of the breakdown. Electrical trees started from bow-tie trees (>600μm) touch the semiconductive shields in Region A and B. From these results, it is clear that the decrease of the breakdown voltage during the accelerated test is mainly caused by these bow-tie trees. In Region C, we conjecture that the breakdown voltage is reduced by bow-tie trees untouch the semiconductive shields. Furthermore, we investigated the influence of bow-tie trees touch the
semiconductive shields on the breakdown voltage, it was found that the voltage changes by the moisture at bow-tie trees.
Right : This paper describes the change of the residual AC breakdown voltages of 6.6kV dry-cured XLPE cables during an immersed accelerated aging test. The influence of bow-tie trees on the breakdown voltages was investigated in detail. The accelerated tests was carried out by applying 6.9kV (1kHz) at room temperature with the conductor strands and insulation shields kept constantly moist. In the breakdown tests, the initial voltage step was 35kV/hour and subsequent voltage step was 5kV/half hour. The residual breakdown voltage changes very much during the accelerated test. From the results of Weibull distribution plot on the AC breakdown voltages, the cause of the breakdown can be divided into three regions; Region A (35kV), Region B (35-90kV) and Region C (>90kV). To clarify the causes of each regions, we used the prebreakdown partial discharge detection method to determine the starting point of the breakdown. Electrical trees started from bow-tie trees (>600μm) touch the semiconductive shields in Region A and B. From these results, it is clear that the decrease of the breakdown voltage during the accelerated test is mainly caused by these bow-tie trees. In Region C, we conjecture that the breakdown voltage is reduced by bow-tie trees untouch the semiconductive shields. Furthermore, we investigated the influence of bow-tie trees touch the semiconductive shields on the breakdown voltage, it was found that the voltage changes by the moisture at bow-tie trees.

Date of correction: July 15, 2008 Reason for correction: - Correction: PDF FILE Details: -

Abstract

This paper describes the change of the residual AC breakdown voltages of 6.6kV dry-cured XLPE cables during an immersed accelerated aging test. The influence of bow-tie trees on the breakdown voltages was investigated in detail. The accelerated tests was carried out by applying 6.9kV (1kHz) at room temperature with the conductor strands and insulation shields kept constantly moist. In the breakdown tests, the initial voltage step was 35kV/hour and subsequent voltage step was 5kV/half hour. The residual breakdown voltage changes very much during the accelerated test. From the results of Weibull distribution plot on the AC breakdown voltages, the cause of the breakdown can be divided into three regions; Region A (35kV), Region B (35-90kV) and Region C (>90kV). To clarify the causes of each regions, we used the prebreakdown partial discharge detection method to determine the starting point of the breakdown. Electrical trees started from bow-tie trees (>600μm) touch the semiconductive shields in Region A and B. From these results, it is clear that the decrease of the breakdown voltage during the accelerated test is mainly caused by these bow-tie trees. In Region C, we conjecture that the breakdown voltage is reduced by bow-tie trees untouch the semiconductive shields. Furthermore, we investigated the influence of bow-tie trees touch the semiconductive shields on the breakdown voltage, it was found that the voltage changes by the moisture at bow-tie trees.

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