IEEJ Transactions on Fundamentals and Materials
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
Fabrication of NbCxN1-x Superconducting Thin Films Deposited by Reactive Sputtering
Hiroaki MakimuraKiiti KamimuraYoshiharu Onuma
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1994 Volume 114 Issue 6 Pages 476-480

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Abstract

NbCxN1-x thin films were prepared on glass substrates by reactive sputtering in a mixture gases of Ar, CH4 and N2 using Niobium plate as a target. The substrate temperature was varied in the high temperature range from 500 to 900°C. Structural properties were investigated by X-ray diffraction. Preferred orientation was observed for the thin films deposited at the substrate temperature of 800°C. Thin films had smooth surface and high mechanical hardness. The Vickers hardness of NbC and NbCxN1-x thin film was about 1150 and from 600 to 700, respectively. The electrical conductivity of thin film was 1.0×104[S/cm]. The highest turn on temperature of 16.2 [K] was observed for the NbCxN1-x thin film. These properties are of importance for the fabrication of NbCxN1-x superconducting devices.

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