抄録
This paper describes an application of ESCA analysis for semiconducting materials in XLPE power cables in terms of the oxygen ratio (defined as the ratio: integrated intensity of oxygen spectrum/integrated intensity of carbon spectrum). Analyzed materials were carbon blacks, an additive mixed into semiconducting materials and several semiconducting materials treated in various cross-linking conditions. It was found that the additive increases the exygen ratio of semiconducting materials as well as cross-linking treatment does. The more the oxygen ratio of the semiconducting materials increases, the less the averaged lamellar angle in XLPE insulation at the semiconducting interface decreases. The angle is though to be a parameter which concerns the hyper-structure of polymer insulation and the less angle value corresponds to the better state of the semiconducting interface in XLPE power cables.
