抄録
At the performance test of power cables, it becomes an important factor to measure a large electrostatic capacitance. In such an application, it is desirable to use a standard capacitor that has the capacitance as large as the test piece. In this paper, the authors propose a method of constructing a high performance large capacitance capacitor using a microprocessor based circuit. The dielectric loss tangent of the electronically constructed 0.1 μF capacitor has been measured as less than 1×10-5. The temperature coefficient of the electronic capacitor can easily be compensated and a temperature coefficient of less than 1 ppm/°C has been attained.
