電気学会論文誌D(産業応用部門誌)
Online ISSN : 1348-8163
Print ISSN : 0913-6339
ISSN-L : 0913-6339
論文
温度ゆらぎによる配電盤母線接続部劣化診断手法の開発
高木 義之犬島 浩
著者情報
ジャーナル フリー

2008 年 128 巻 5 号 p. 584-587

詳細
抄録
We developed deterioration diagnosis technique for bus Joint in Switchboards. Increase of contact resistance by deterioration of a bus joint causes a temperature rise. However, it is difficult to really measure a temperature rise by a minute change of contact resistance. That is a method to detect a change of contact resistance of a bus joint as a temperature fluctuation. We expect that a serious accident such as a short circuit is prevented beforehand by this technique.
著者関連情報
© 電気学会 2008
前の記事 次の記事
feedback
Top