Local Characterization of Optical and Electronic Properties by Means of Atomic Force Microscopy

The Journal of The Institute of Electrical Engineers of Japan

Online ISSN : 1881-4190
Print ISSN : 1340-5551
ISSN-L : 1340-5551

SPECIAL ISSUE on Development of Scanning Probe Microscopy Techniques and It's Applications

Local Characterization of Optical and Electronic Properties by Means of Atomic Force Microscopy

Takuji TAKAHASHI

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JOURNAL FREE ACCESS

2014 Volume 134 Issue 12 Pages 808-811

DOI https://doi.org/10.1541/ieejjournal.134.808

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[in Japanese]

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© 2014 The Institute of Electrical Engineers of Japan

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